29-31 January, 2014
The 13th International Nanotechnology Exhibition & Conference, at Tokyo Big Sight
For the fourth time Nanovie was invited by National Science Council (NSC) Taiwan to represent Taiwan's achievements in the field of nanotechnology. Among other 24 technologies, we will be presenting the following two:
The new Nanovie STM Lepto resolves to sub-nanometer scale under ambient conditions and is also capable of nano-lithography, I-V curve measurement and in-liquid scanning.
The scan tip making device can automatically fabricate 6 scan tips per 15 minutes. The results demonstrate a consistent production of curvature radii less than 100 nm under SEM inspection, ideal for demanding STM scans.