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Nanovie |
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Particle Analysis |
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Raman Spectroscopy |
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Raman Spectrometer |
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Semiconductor |
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Compact SEM |
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UV Surface Processing |
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Educational Kits |
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Bio-medical |
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STM for Education
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Nanovie STM Educa
Scanning Tunneling Microscope
opened the door for all the students and trainees to explore into the nano-world much earlier and easier than it used to be. Imaging of atoms, characteristics of nanostructures, nano morphology of conducting surfaces, nanostructuring by self organsisation, to name a few, can be seen by undergraduate students through their own hands-on operation.
Application
Education:
Modern Physics Experiment, Fundamental Physics Experiment, and a variety of experiments in the fields of Material Sciences, Quantum Mechanics, Chemistry, etc.
Training:
Ideal for training before operating a commercial STM.
Research:
For graduate / post-graduate students or small labs in the fields of Nanotechnology, Semiconductor, Optoelectronics, Surface Materials, Solid-State Physics and Chemistry, etc.
* Pictures on the right are shown to the scale of a 11" laptop. |
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Open Mechanical Structure
facilitating the learning of STM design and inspiring the learners in an instuitive manner.
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Manual Operation
enhancing effectively the hands-on experience about how the tunnelling current occurs.
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General Physics Experiments, Innovative Experiments |
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Every student can operate the STM in person
10 ~ 15 sets of STM Educa kits will enable everyone among the 30~60 students in each laboratory class actively operate the machine in person.
Students in all science and engineering departments will benefit from such program, totalling 400 ~ 1200 students each academic year each school.
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Nano-world at different scan ranges |
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N-terface: Friendly Scan Interface |
N-mage: Image Processing & Analysis
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- Improve the scan in real time
Scan image and line profile are displayed in real time during a scan to help you fine-tune the parameters any time during the scan.
- Fast data harvesting speed
3 minutes for an image with average image quality.
- Graphic interface
for the control of Scan area, scan position, scan direction, and other parameters.
- Demonstration modes
available for teaching and presentation purposes.
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- Visualise the true surface
De-slope, noise reduction, Fourier transform and other filters.
- Enhance the features
3D display with lighting effects, plus a variety of palettes available.
- Comprehensive analysis tools
Line profiling, height histogram, roughness estimation, volume / perimeter calculation, island number counting.
- Able to read all major file formats.
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Specifications:
| STM Scan Range and Resolution |
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Large-Area Scan |
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Maximum XY Scan Range
Physical XY Resolution
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High-Resolution Scan |
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Maximum XY Scan Range
Physical XY Resolution
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Maximum Z Scan Length
Physical Z Resolution |
~ 1.0 μm
~ 0.1 nm |
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Tunneling Current |
0.1 – 100 nA |
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Sample Bias Voltage |
±10 V |
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Machine Dimension (mm) |
260 (W) X 190 (H) X 120 (D) |
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Machine Weight |
3.4 kg |
Scanner Features |
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Scan Mode |
Constant Current |
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Scan Image Size |
100 x 100 ~ 550 x 550 points |
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Scan Head |
Two Exchangeable Heads for different Scan Area |
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Standard Tip |
Tungsten (CR ≤ 100nm) |
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Sample Holder |
Magnetic quick change attachment |
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Tip-to-sample Approach |
Manual approach, with real-time camera monitoring & software detection |
Electronic Box |
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Input/Output Channels |
16-bit A/D and D/A converters |
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Scan Drive Voltage |
±10 V |
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Dimensions (mm) |
211 (W) x 40 (H) X 85 (D) |
Computer Requirement |
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Operating System |
Windows 2000, XP, Vista, 7 |
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Connecting Port |
Two (2) USB ports |
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