Nanovie - Company Name Logo Slogan
正體中文 25 px width 日本語 25 px width ENGLISH 25 px width
menu left menu news menu products menu tutorial menu spport menu about

STM for Education


Nanovie STM Educa

Scanning Tunneling Microscope

opened the door for all the students and trainees to explore into the nano-world much earlier and easier than it used to be. Imaging of atoms, characteristics of nanostructures, nano morphology of conducting surfaces, nanostructuring by self organsisation, to name a few, can be seen by undergraduate students through their own hands-on operation.



    Modern Physics Experiment, Fundamental Physics Experiment, and a variety of experiments in the fields of Material Sciences, Quantum Mechanics, Chemistry, etc.


    Ideal for training before operating a commercial STM.


    For graduate / post-graduate students or small labs in the fields of Nanotechnology, Semiconductor, Optoelectronics, Surface Materials, Solid-State Physics and Chemistry, etc.

* Pictures on the right are shown to the scale of a 11" laptop.


Nanovie STM Educa VII Machine

Nanovie STM Educa Electronic Control Box

Nanovie STM Educa Laptop Size Comparison

    • Open Mechanical Structure
      facilitating the learning of STM design and inspiring the learners in an instuitive manner.

    • Manual Operation
      enhancing effectively the hands-on experience about how the tunnelling current occurs.


General Physics Experiments, Innovative Experiments

  Professor demonstrating the operation of Nanovie STM Educa

Every student can operate the STM in person

10 ~ 15 sets of STM Educa kits will enable everyone among the 30~60 students in each laboratory class actively operate the machine in person.
Students in all science and engineering departments will benefit from such program, totalling 400 ~ 1200 students each academic year each school.


Nano-world at different scan ranges

  Scan Images of DVD grooves and Blu-ray Disc

N-terface: Friendly Scan Interface

N-mage: Image Processing & Analysis

  Scan Control Interface Displays Real Time Results Line Profiling of the Hole Array
  • Improve the scan in real time
  • Scan image and line profile are displayed in real time during a scan to help you fine-tune the parameters any time during the scan.

  • Fast data harvesting speed
    3 minutes for an image with average image quality.

  • Graphic interface
    for the control of Scan area, scan position, scan direction, and other parameters.

  • Demonstration modes
    available for teaching and presentation purposes.
  • Visualise the true surface
    De-slope, noise reduction, Fourier transform and other filters.

  • Enhance the features
    3D display with lighting effects, plus a variety of palettes available.

  • Comprehensive analysis tools
    Line profiling, height histogram, roughness estimation, volume / perimeter calculation, island number counting.

  • Able to read all major file formats.




STM Scan Range and Resolution
  Large-Area Scan  
    Maximum XY Scan Range
    Physical XY Resolution
    ~ 4.0 μm
    ~ 5.0 nm
  High-Resolution Scan  
    Maximum XY Scan Range
    Physical XY Resolution
    ~ 1.5 μm
    ~ 3.0 nm
  Maximum Z Scan Length
Physical Z Resolution
~ 1.0 μm
~ 0.1 nm
  Tunneling Current 0.1 – 100 nA
  Sample Bias Voltage ±10 V
  Machine Dimension (mm) 260 (W) X 190 (H) X 120 (D)
  Machine Weight 3.4 kg

Scanner Features
  Scan Mode Constant Current
  Scan Image Size 100 x 100 ~ 550 x 550 points
  Scan Head Two Exchangeable Heads for different Scan Area
  Standard Tip Tungsten (CR ≤ 100nm)
  Sample Holder Magnetic quick change attachment
  Tip-to-sample Approach Manual approach, with real-time camera monitoring & software detection

Electronic Box
  Input/Output Channels 16-bit A/D and D/A converters
  Scan Drive Voltage ±10 V
  Dimensions (mm) 211 (W) x 40 (H) X 85 (D)

Computer Requirement
  Operating System Windows 2000, XP, Vista, 7
  Connecting Port Two (2) USB ports

© 2007-2022 Nanovie™ Co., Ltd. All Rights Reserved. 25 px width